Skip to main content

NUANCE: Nanoscale Characterization Experimental Center

Electron Probe Instrumentation Center (EPIC)

"Snowswept Memory" by Haomiao Xie
"Snowswept Memory" : by Haomiao Xie / Created on the Hitachi SU8030


EPIC houses instruments for scanning electron microscopy (SEM), transmission electron microscopy (TEM) including scanning transmission electron microscopy (STEM), focused-ion beam (FIB) and specimen preparation facility (SPF). EPIC jointly collaborates with the Quantitative Bioelemental Imaging Center (QBIC) core facility as well.

EPIC receives support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-2025633); the MRSEC program (NSF DMR-1121262) at the Materials Research Center; the International Institute for Nanotechnology (IIN); and the State of Illinois, through the IIN.  EPIC houses one of the most complete arsenals of routine and state-of-the-art electron microscopes in the world.


Detailed information about surface morphology, size/shape analysis, local chemistry, crystallography/texture can be obtained with our scanning electron microscopes.

Learn More


Transmission Electron Microscopy (TEM) offers the opportunity to probe the crystal structure, defects, local chemistry, electronic structure and related information at a nanometer-or-less length scale

Learn More


The EPIC-FIB facility houses two focused ion beam / scanning electron microscopes (FIB-SEM), each with its own specialized set of capabilities.

Learn More