Our mission is to provide and continually update state-of-the-art and core analytical characterization instrumentation resources, with 24/7 open access, for all of NU and beyond. The word “resource” includes not only mere “instrumentation and access,” but also hands-on training, education, research collaboration and outreach. NUANCE aspires to be a pro-active and integral part of all scholarly activities related to characterization at and beyond NU.
The upper right is the surface of chewing gum. The rest are etched silicon surface. Images taken with the High Resolution Stylus Profilometer by Dr. Xinqi Chen
Bruker Dimension FastScan® Atomic Force Microscope (AFM) - A set of high-quality images ranging from high-resolution topography images of a 20μm area to subsections 10 times smaller than the original scan.