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Facility

SPID

Bruker ICON System

Bruker Icon

Main Application


Ultimate Performance

  • Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on a large-sample, tip-scanning AFM

  • Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in Tapping Mode

  • Drift rates less than 200pm per minute render distortion-free images

  • Direct force control prevents tip damage, even on very hard, rough samples

  • Reduces occurrence of artifacts due to dull or broken probe tips

  • Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation

  • Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features

  • Probe Stays Sharp after Many Scans


Scan Asyst: Exclusive Self-Optimizing AFM Scan Technology

  • Faster, More Consistent Expert-Quality Results

  • Direct Force Control Protects Samples and Probes

  • Easier Imaging in Air or Fluid on Almost Any Sample

  • Automatic image optimization results in faster, more consistent results, regardless of user skill level

  • Direct force control at ultra-low forces helps protect delicate samples and tips from damage

  • Elimination of cantilever tuning, setpoint adjustment, and gain optimization makes even fluid imaging simple


Modes

  • Contact Mode

  • Tapping Mode

  • Phase Imaging

  • HarmoniX

  • Nanolithography and Nanomanipulation

  • Force Volume Spectroscopy

  • Piezoresponse Force Modulation Lateral Force Microscopy (LFM) Magnetic Force Microscopy (MFM) Electric Force Microscopy (EFM) Surface Potential Scanning

  • Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM)

  • Tunneling Atomic Force Microscopy (TUNA) Conductive Atomic Force Microscopy (CAFM)

  • Torsional Resonance Mode (TRmode) TR-TUNA

  • Dark Lift for TUNA


Superior Versatility

  • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments

  • Instrument and software designed to take full advantage of all current and future Veeco AFM modes and techniques

  • Custom user-programmable scripts offer semi-automated measurement and analysis


Exceptional Productivity

  • New NanoScope® software with default experiment modes distills decades of knowledge into preconfigured settings

  • Integrated feedback alignment tools deliver quick and optimized probe positioning

  • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation


Applications

Material Mapping: Icon supports Veeco’s revolutionary HarmoniX™ Nanoscale Material Property Mapping mode for measuring variations in material properties for independent nanometer-scale images of adhesion, stiffness, peak force, dissipation and average force. HarmoniX microscopy delivers high throughput with high resolution, while maintaining the non-destructive qualities of Tapping Mode imaging.

Electrical Characterization: Carry out electrical characterization at the nanoscale with greater sensitivity and dynamic range using Veeco-proprietary modes. Combine these investigations with other techniques, such as Dark Lift, for artifact-free results in scanning capacitance microscopy, scanning spreading resistance, tunneling AFM or torsional resonance tunneling AFM.

Nanomanipulation: Perform manipulation and lithography at the nanometer and molecular scales. The Icon’s XYZ closed-loop scanner provides precise probe positioning with no piezo creep and extremely low noise for the best positioning of any available nanomanipulation system.

Heating and Cooling: Execute temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes. Alternately, perform sub-100 nanometer local heating to 400°C using a thermal probe.

Even Fluid Imaging Is Now Easy

  • Very low imaging force, here 50 pN, limits compression of soft samples

  • Imaging remains stable for extended periods because setpoint does not drift

Image Features That TappingMode Can’t

  • Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation

  • Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features

Probe Stays Sharp after Many Scans

  • Direct force control prevents tip damage, even on very hard, rough samples

  • Reduces occurrence of artifacts due to dull or broken probe tips

 


Watch a Video Tutorial about the Instrument!