Bruker ICON System
Main Application
Ultimate Performance
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Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on a large-sample, tip-scanning AFM
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Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in Tapping Mode
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Drift rates less than 200pm per minute render distortion-free images
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Direct force control prevents tip damage, even on very hard, rough samples
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Reduces occurrence of artifacts due to dull or broken probe tips
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Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation
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Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features
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Probe Stays Sharp after Many Scans
Scan Asyst: Exclusive Self-Optimizing AFM Scan Technology
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Faster, More Consistent Expert-Quality Results
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Direct Force Control Protects Samples and Probes
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Easier Imaging in Air or Fluid on Almost Any Sample
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Automatic image optimization results in faster, more consistent results, regardless of user skill level
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Direct force control at ultra-low forces helps protect delicate samples and tips from damage
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Elimination of cantilever tuning, setpoint adjustment, and gain optimization makes even fluid imaging simple
Modes
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Contact Mode
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Tapping Mode
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Phase Imaging
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HarmoniX
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Nanolithography and Nanomanipulation
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Force Volume Spectroscopy
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Piezoresponse Force Modulation Lateral Force Microscopy (LFM) Magnetic Force Microscopy (MFM) Electric Force Microscopy (EFM) Surface Potential Scanning
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Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM)
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Tunneling Atomic Force Microscopy (TUNA) Conductive Atomic Force Microscopy (CAFM)
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Torsional Resonance Mode (TRmode) TR-TUNA
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Dark Lift for TUNA
Superior Versatility
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Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
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Instrument and software designed to take full advantage of all current and future Veeco AFM modes and techniques
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Custom user-programmable scripts offer semi-automated measurement and analysis
Exceptional Productivity
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New NanoScope® software with default experiment modes distills decades of knowledge into preconfigured settings
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Integrated feedback alignment tools deliver quick and optimized probe positioning
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High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
Applications
Material Mapping: Icon supports Veeco’s revolutionary HarmoniX™ Nanoscale Material Property Mapping mode for measuring variations in material properties for independent nanometer-scale images of adhesion, stiffness, peak force, dissipation and average force. HarmoniX microscopy delivers high throughput with high resolution, while maintaining the non-destructive qualities of Tapping Mode imaging.
Electrical Characterization: Carry out electrical characterization at the nanoscale with greater sensitivity and dynamic range using Veeco-proprietary modes. Combine these investigations with other techniques, such as Dark Lift, for artifact-free results in scanning capacitance microscopy, scanning spreading resistance, tunneling AFM or torsional resonance tunneling AFM.
Nanomanipulation: Perform manipulation and lithography at the nanometer and molecular scales. The Icon’s XYZ closed-loop scanner provides precise probe positioning with no piezo creep and extremely low noise for the best positioning of any available nanomanipulation system.
Heating and Cooling: Execute temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes. Alternately, perform sub-100 nanometer local heating to 400°C using a thermal probe.
Even Fluid Imaging Is Now Easy
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Very low imaging force, here 50 pN, limits compression of soft samples
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Imaging remains stable for extended periods because setpoint does not drift
Image Features That TappingMode Can’t
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Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation
-
Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features
Probe Stays Sharp after Many Scans
-
Direct force control prevents tip damage, even on very hard, rough samples
-
Reduces occurrence of artifacts due to dull or broken probe tips