Materials Characterization with Hitachi’s HD-2300 Ultra High Resolution FE-STEM

Hitachi’s newest high resolution, high throughput HD-2300 STEM has been designed for quick, comprehensive sample evaluation with its unmatched analytical capabilities and consistent high-end performance. Attached with specially designed dual EDS detectors and cryo-holder, this STEM from Hitachi can work at 80, 120 and 200kV. It will be the latest analytical tool to study microstructure of bio-, soft and organic materials at high resolution.

The best choice for bio- and soft-materials:  By integrating two X-ray energy dispersive spectrometry (EDS), it will be the most sensitive analytic STEM. It is an ultra-high resolution field emission (EF) STEM, capable of simultaneously multiple signals: high voltage secondary electron (SE) image, phase contrast image, Z-contrast image, nano-diffraction, EDS and EELS (electron energy loss spectrum).  0.34 nm resolution is guaranteed for all images. Low voltage (80 and 120 kV) capability , specially designed cryo-holder and low-dose operation mode will make the microscope a powerful and analytic tool for biological and medical research.

Easy to operate: Hitachi’s hiper-stage provides fine control of sample movement, lowest vibration interference, and +/-30 degree tilt for flexibility. The HD-2300 is equipped with a straightforward user interface to facilitate quick and accurate data generation. Possessing numerous automated functions the HD2300 is truly a universal instrument- axial alignment, aperture alignment, focus, stigma, brightness and contrast. Its 3-Angstrom resolution and substantial signal collection guarantee that quality results are easily obtainable.

Powerful tool for nanotechnology: High-resolution imaging coupled with the best analytical geometries ensures accurate results and advances in nanotechnology. Gathering large amounts of information quickly for immediate understanding of complex samples the HD-2300 comes standard with Secondary Electron, High Angle Annular Darkfield, and Brightfield detectors for routine imaging. Hitachi’s live diffraction observation allows simultaneous viewing of the image and diffraction pattern to guide analysis and determine sample orientation.