1/10/2008 [NUANCE] NUANCE Welcomes Visiting Scholar Atsushi Muto from Hitach
Our first-ever visiting scholar, Atsushi Muto is an engineer from Hitachi High-Technology America (HHTA). Mr. Muto made EPIC his professional home for six months to assist users in high-level SEM projects, especially on our new Hitachi S4800-II FE SEM, an ultra-high resolution cFEG SEM (<1nm) that offers upper and lower SE detectors; a beam deceleration mode for ultra-low voltage imaging, and a STEM detector for bright/dark field imaging.
