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NUANCE Hosts Bruker Seminar

On Tuesday, November 19, 2019, representatives from Bruker Corporation facilitated a seminar and demonstration workshop focusing on advanced applications of infrared and ramen spectroscopy. The aim of this seminar was to explore the basic and the advanced techniques used in FTIR spectroscopy.

Dr. Sergey Shilov, Senior Applications Scientist at Bruker, discussed optimization of instrument components, acquisition parameters, and post processing methods to obtain high quality FTIR spectra in the introductory session.

The afternoon session touched on FTIR solution for thin film characterizations; absorption enhancement with polarized light; reduction of water vapor influence; overview of accessories for surface science, C and O quantification in Si; polarization modulation techniques; and electrochemistry. The afternoon session was immediately followed by a demonstration on the FTIR instrument in the Keck II facility lab presented by Chris Kelly, Bruker's midwest regional sales representative. 

A very informative workshop indeed! Thanks Bruker!

 

Dr. Chen opening remarks

Dr. Chen welcomes Bruker and participants 

 

Dr. Sergey Shilov
 Dr. Sergey Shilov answers some questions

 

Demo in KECK II

Chris Kelly in Keck-II Lab

 

Data analysis

Gathering samples for demonstrations

 

reviewing data in the demo

Analyzing Sample

 

reviewing data