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"New Methods for Improved Characterization of Silica Nanoparticle-Based Drug Delivery Systems"

Dr. Michael W. Ambrogio, Dr. Xinqi Chen from the Keck-II facility of the NUANCE Center, and Dr. Marco Frasconi, Dr .M. Deniz Yilmaz from the Center for the Chemistry of Integrated Systems have developed new methods to characterize nanoparticle-based drug delivery systems using XPS and ToF-SIMS

Abstract: The incorporation of silica nanoparticles into drug delivery vehicles, and other nanotech platforms, has experienced rapid and significant growth over the past decade. However, as these nanoparticle-based systems become more and more complex, the methods used to analyze these systems have evolved at a comparatively much slower pace, resulting in the need for researchers to expand their toolbox and devise new strategies to characterize these materials. This article describes how X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were recently employed in the analysis of two separate drug delivery systems which contain organic compounds covalently attached to the surfaces of silica nanoparticles. These techniques provided a deluge of qualitative and quantitative information about these drug delivery systems, and have several clear advantages over more common characterization procedures such as Fourier transform infrared spectroscopy (FT-IR) and solid state nuclear magnetic resonance (SSNMR). Thus, XPS and ToF-SIMS should be an integral component of the standard characterization protocol for any nanoparticle-based assemblies—particularly silica-based drug delivery systems—as this field of research continues to develop.

You can find the complete article here on the ACS website.