NEXA G2 XPS
Features:
· Analyzer type: 180-degree double-focusing, hemispherical analyzer with 128-channel detector
· X-ray source type: Monochromated, micro-focused, low-power Al K-Alpha X-ray source
· X-ray spot size: 10 to 400 um (adjustable in 5 um step)
· Depth profiling: EX06 monatomic Ar ion source and cluster Ar ion source
· Maximum sample area: 60 mm x 60 mm
· Maximum sample thickness: 20 mm
· Sample transfer: Fully automatic transfer
· Air free transfer: equipped
· Sample rotation: equipped
