Transmission electron microscopes offer the opportunity to probe the crystal structure, defects, local chemistry, electronic structure and related information at a nanometer-or-less length scale. This allows one to view individual atoms in a specimen, allowing a person to identify grain boundaries and other imperfections in a specimen.
The EPIC facility houses two advanced transmission electron microscopes, along with a complete array of specimen preparation tools.

• High brightness FEG operated at 80, 120 and 200 kV
• Two X-ray EDS detectors make it most sensitive in the world
• Secondary electron detector for SE imaging
• Bright-field detector for phase contrast STEM imaging
• Annular dark field detector for Z-contrast STEM imaging
• Gatan Cryo-TEM holder and transfer system
• Low-dose operation mode
• Gatan Enfina EELS spectrometer (to be installed at the end of 2009)
• Hitachi live CCD for nano-diffraction
• High voltage cryo-SEM capability: secondary electron imaging is suitable for checking thick and frozen samples, like cells, tissues up to tens of micron
• Gatan heating stage, up to 900 degree

• 200kV thermionic emission (W hairpin filament)
• Large specimen tilt (+/- 45 degrees) pole piece
• In situ specimen straining and deformation stage
• CBED, nanodiffraction capabilities
• Hollow-Cone Illumination
• TV rate CCD camera
• PGT X-Ray detector and analysis system

 Hitachi H8100 Manual
 Non-NU user application form

• High brightness Schottky emitter operated at 200kV
• BF/ADF STEM detectors, EDS system and EMISPEC system for atomic resolution Z-contrast imaging, sub-nanoscale resolution EDS and PEELS point analysis, and automated line scans and maps.
• UTW x-ray detector
• Gatan TV-rate CCD camera
• Top-hat aperture to eliminate hard x-rays
• Several side-entry specimen holders
• Standard single and double-tilt holders
• Low-Z(Be) holder for analytical x-ray microanalysis