Transmission electron microscopes offer the opportunity to probe the crystal structure, defects, local chemistry, electronic structure and related information at a nanometer-or-less length scale. This allows one to view individual atoms in a specimen, allowing a person to identify grain boundaries and other imperfections in a specimen.
The EPIC facility houses two advanced transmission electron microscopes, along with a complete array of specimen preparation tools.

• High brightness cFEG operated at 200kV
• BF/ADF STEM detectors with simultaneous Emispec PC acquisition system for STEM, EDS and EELS detectors for automated line scans, maps and spatially resolved analytical studies at nanoscale resolution
• UTW x-ray detector
• Gatan TV-rate CCD camera
• Rotatable electrostatic biprism for electron holography
• Top-hat aperture to eliminate hard x-rays
• Several side-entry specimen holders
• Standard single and double-tilt holders
• Heating holder
• Liquid nitrogen (double-tilt) cooling holder
• Liquid helium cooling holder for in situ superconductor studies
• In situ I-V probe holder
• Low-Z(Be) holder for analytical x-ray microanalysis
• Gatan Image Filter

Hitachi HF-2000 Manual
 Non-NU user application form

• 200kV thermionic emission (W hairpin filament)
• Large specimen tilt (+/- 45 degrees) pole piece
• In situ specimen straining and deformation stage
• CBED, nanodiffraction capabilities
• Hollow-Cone Illumination
• TV rate CCD camera
• PGT X-Ray detector and analysis system

 Hitachi H8100 Manual
 Non-NU user application form

• High brightness Schottky emitter operated at 200kV
• BF/ADF STEM detectors, EDS system and EMISPEC system for atomic resolution Z-contrast imaging, sub-nanoscale resolution EDS and PEELS point analysis, and automated line scans and maps.
• UTW x-ray detector
• Gatan TV-rate CCD camera
• Top-hat aperture to eliminate hard x-rays
• Several side-entry specimen holders
• Standard single and double-tilt holders
• Low-Z(Be) holder for analytical x-ray microanalysis