TEM

Transmission electron microscopes offer the opportunity to probe the crystal structure, defects, local chemistry, electronic structure and related information at a nanometer-or-less length scale. This allows one to view individual atoms to identify grain boundaries and other imperfections in a specimen.

The EPIC facility houses three advanced transmission electron microscopes, along with a complete array of specimen preparation tools.


   Click here to view the TEM Introductory Video

  

  Hitachi HD-2300A STEM

  • High brightness FEG operated at 80, 120 and 200 kV
  • Ultra-sensitive dual-EDS capability, compatible with cryogenic specimen holder and low kV (80,120) operation
  • Gatan Enfina EELS system
  • Secondary electron detector for SE imaging
  • Multiple STEM imaging modalities (BF, ADF, HAADF), down to ~ 0.23 nm
  • Gatan Cryo-TEM holder and transfer system
  • Low-dose operation mode
  • Gatan diffraction CCD for nano-diffraction with a full-space tilting rotation holder
  • High voltage cryo-SEM capability: secondary electron imaging is suitable for checking thick and frozen samples, like cells, tissues up to tens of micron
  • Gatan heating stage, up to 900 degrees

Hitachi HD-2300A STEM



  Hitachi H8100 TEM

  • 75kV to 200kV thermionic emission (W hairpin filament)
  • Large specimen tilt (+/- 45 degrees) pole piece
  • In situ heating experiments with a heating stage (up to 900 degrees)
  • A cryo-TEM with a cryo-holder (down to -170 degrees)
  • High quality Gatan TV rate CCD camera for imaging (down to 0.5 nm resolultion) and diffraction (large tilting with a Gatan double tilt holder)
  • Operation at low kV (75 and 100 kV) for soft- and bio-materials and 200 kV for inorganic materials
  • CBED, nanodiffraction capabilities
  • Hollow-Cone Illumination

pdficon Hitachi H8100 Manual
Click here, download the file Non-NU user application form

Hitachi 8100-TEM

  JEOL JEM-2100 FAST TEM 


  • Analytical Scanning Transmission Atomic Resolution  (A STAR) Electron Microscope
  • High brightness Schottky FEG emitter operated at 200kV
  • 0.1 nm lattice resolution in HRTEM mode
  • 0.2 nm spatial resolution in STEM and analytical mode
  • HAADF STEM detector, Oxford EDS system and Gatan GIF system for atomic resolution Z-contrast imaging, sub-nanoscale resolution EDS and EELS point analysis, and automated line scans and maps
  • Gatan double-tilt heating stage (up to 1100 degrees)
  • Low-Z(Be) double -tilt holder for analytical x-ray microanalysis
  • Hummingbird tomography holder for 3D tomography
  • Remote operation for research and educational purposes
JEOL 2100 TEM

  Related topics:  SPF Facility, EPIC - NUANCE Center

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