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Transmission electron microscopes offer the opportunity to probe the crystal structure, defects, local chemistry, electronic structure and related information at a nanometer-or-less length scale. This allows one to view individual atoms to identify grain boundaries and other imperfections in a specimen.

The EPIC facility houses three advanced transmission electron microscopes, along with a complete array of specimen preparation tools.

TEM Introductory Video available in the NUANCE "Education and Outreach" section.

Hitachi HT-7700 Biological TEM

  • Resolution 0.20nm latticeHitachi HT7700 TEM

  • 40 to 120kV at 100V increments

  • Magnification of 50-1000x, with 200x - 600,000x zoom

  • Image rotation +/- 90˚ in 15˚ steps

  • STEM unit at 1 nm resolution

  • Bruker EDS system for elementary analysis

  • Hitachi HT7700 Manual

Hitachi HD-2300 Dual EDS Cryo STEM

  • High brightness FEG operated at 80, 120 and 200 kVHitachi HD-2300A STEM

  • Ultra-sensitive dual-EDS capability, compatible with cryogenic specimen holder and low kV (80,120) operation
  • Gatan Enfina EELS system

  • Secondary electron detector for SE imaging

  • Multiple STEM imaging modalities (BF, ADF, HAADF), down to ~ 0.23 nm

  • Gatan Cryo-TEM holder and transfer system

  • Low-dose operation mode

  • Gatan diffraction CCD for nano-diffraction with a full-space tilting rotation holder

  • High voltage cryo-SEM capability: secondary electron imaging is suitable for checking thick and frozen samples, like cells, tissues up to tens of micron

  • Gatan heating stage, up to 900 degrees

  • Hitachi HD-2300A Manual

Hitachi H-8100 TEM

  • 75kV to 200kV thermionic emission (W hairpin filament)

    Hitachi 8100-TEM

  • Large specimen tilt (+/- 45 degrees) pole piece

  • In situ heating experiments with a heating stage (up to 900 degrees)

  • A cryo-TEM with a cryo-holder (down to -170 degrees)

  • High quality Gatan TV rate CCD camera for imaging (down to 0.5 nm resolution) and diffraction (large tilting with a Gatan double tilt holder)

  • Operation at low kV (75 and 100 kV) for soft- and bio-materials and 200 kV for inorganic materials

  • CBED, nanodiffraction capabilities

  • Hollow-Cone Illumination

  • Hitachi H8100 Manual


  • Analytical Scanning Transmission Atomic Resolution  (A STAR) Electron Microscope

  • JEOL 2100 TEM

    High brightness Schottky FEG emitter operated at 200kV

  • 0.1 nm lattice resolution in HRTEM mode

  • 0.2 nm spatial resolution in STEM and analytical mode

  • HAADF STEM detector, Oxford EDS system and Gatan GIF system for atomic resolution Z-contrast imaging, sub-nanoscale resolution EDS and EELS point analysis, and automated line scans and maps

  • Gatan double-tilt heating stage (up to 1100 degrees)

  • Low-Z(Be) double -tilt holder for analytical x-ray microanalysis

  • Hummingbird tomography holder for 3D tomography

  • Remote operation for research and educational purposes

  • JEOL JEM-2100 FasTEM Manual

Related topics: SPF Facility