Tuning Fork Feedback

High resonant frequencies High Q factors Tuning forks were pioneered in scanned probe microscopy by K. Karrai and M. Haines, US Patent Number 5,641,896. The work of Karrai and coworkers as patented were for straight near-field optical/AFM elements with highly restricted geometries of tip attachment and movement. Nanonics extends this technology in two directions: first, the use of proprietary, simple mounting techniques that maintain resonance frequencies and Q factors. Second, applying these mounting techniques to cantilevered near-field optical and AFM elements to provide performance at the limits attainable with scanned probe techniques.

Key Features of Tip scanning

Add to any existing optical microscope, including UV confocal microscopes On-line viewing with lens and tip for imaging and calibration Resolve optical and AFM registration in semiconductor applications Ultra high-resolution thin film measurements.