NIFTI - Instruments

Instruments

DI SPM	NSOM	FEMTO LASER

Phase Imaging is a powerful extension of TappingMode Atomic Force Microscopy (AFM) that provides nanometer-scale information about surface structure often not revealed by other SPM techniques. By mapping the phase of the cantilever oscillation during the TappingMode scan, phase imaging goes beyond simple topographical mapping to detect variations in composition, adhesion, friction, viscoelasticity, and perhaps other properties.

Applications include identification of contaminants, mapping of different components in composite materials, and differentiating regions of high and low surface adhesion or hardness. In many cases, phase imaging complements lateral force microscopy (LFM) and force modulation techniques, often providing additional information more rapidly and with higher resolution.

Phase imaging is as fast and easy to use as TappingMode AFM with all its benefits for imaging soft, adhesive, easily damaged or loosely bound samples and is readily implemented on any MultiMode or Dimension Series SPM with NanoScope III controller equipped with an Extender Electronics Module.