Force Modulation Imaging is a scanning probe microscopy (SPM) technique that identifies and maps differences in surface stiffness or elasticity. It is one of several new techniques developed as extensions to the basic SPM topographical mapping capabilities. These techniques use a variety of surface properties to differentiate among different materials on heterogeneous surfaces.

Force Modulation Imaging can be used in a wide range of applications including identifying transitions between different components in composites, rubber and polymer blends, evaluating polymer homogeneity, imaging organic materials on hard substrates, detecting residual photoresist on integrated circuits, and identifying contaminants on a variety of surfaces

 User Manual for Force Modulation Microscopy