JEOL JSPM-5200

The JSPM-5200 is a multipurpose, high resolution SPM with environmental capabilities. The JSPM-5200 can be used in various native environments -- from ambient air, controlled atmosphere, fluid, or vacuum, with the sample heated to 500° C (773K) or cooled to -143° C (130K). The open architecture of the JSPM-5200 provides multiple access ports and easy access to the probe. The JSPM-5200 can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope (STM) by merely changing the tip. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with either slope detection or frequency detection, and phase imaging.

Features

• Normal contact, tapping and non-contact AFM modes

• Conducting and tunneling AFM, STM, CITS and STS spectroscopy modes

• FMM, viscoelstic AFM, EFM, surface potential, PFM and Kelvin Probe microscopy modes

• Integrated “open” and hermetically sealed “closed” fluid cells

• System handles up to 2 inch diameter and 20 mm thick samples

• Electrical feedthroughs and load lock system

• Piezo-response force microscopy

• Scanning Kelvin Probe microscopy

• Temperature variation: 130 K to 773 K

• Air, liquid, environmental and humidity controlled operations

• High vacuum (10-8 Torr)

• Gas introduction and discharge, vacuum evacuation, LN2 cold finger, three accessory ports

• Vibration isolation: Air suspension, Gel damper